DocumentCode
583601
Title
Auto gain tuning algorithm for automation of atomic force microscope
Author
Jeong, Ji-Seong ; Kim, Ji-Soo ; Jung, Jong-kyu ; Park, Kyi-Hwan
Author_Institution
Sch. of Mechatron., Gwangju Inst. of Sci. & Technol., Gwangju, South Korea
fYear
2012
fDate
17-21 Oct. 2012
Firstpage
1080
Lastpage
1082
Abstract
The performance of AFM is determined by the control gains. The gains have uncertainties which are impacted by a cantilever, sample properties and environment. In commercial AFM, the controller is manually tuned by user. In this paper, auto gain tuning algorithm is suggested for the high performance and automation of AFM.
Keywords
atomic force microscopy; cantilevers; gain control; signal processing; AFM; atomic force microscope; auto gain tuning algorithm; cantilever; control gains; Atomic force microscopy; Atomic measurements; Automation; Force; Topology; Tuning; Atomic Force Microscope; Auto Gain Tuning;
fLanguage
English
Publisher
ieee
Conference_Titel
Control, Automation and Systems (ICCAS), 2012 12th International Conference on
Conference_Location
JeJu Island
Print_ISBN
978-1-4673-2247-8
Type
conf
Filename
6393389
Link To Document