Title :
Auto gain tuning algorithm for automation of atomic force microscope
Author :
Jeong, Ji-Seong ; Kim, Ji-Soo ; Jung, Jong-kyu ; Park, Kyi-Hwan
Author_Institution :
Sch. of Mechatron., Gwangju Inst. of Sci. & Technol., Gwangju, South Korea
Abstract :
The performance of AFM is determined by the control gains. The gains have uncertainties which are impacted by a cantilever, sample properties and environment. In commercial AFM, the controller is manually tuned by user. In this paper, auto gain tuning algorithm is suggested for the high performance and automation of AFM.
Keywords :
atomic force microscopy; cantilevers; gain control; signal processing; AFM; atomic force microscope; auto gain tuning algorithm; cantilever; control gains; Atomic force microscopy; Atomic measurements; Automation; Force; Topology; Tuning; Atomic Force Microscope; Auto Gain Tuning;
Conference_Titel :
Control, Automation and Systems (ICCAS), 2012 12th International Conference on
Conference_Location :
JeJu Island
Print_ISBN :
978-1-4673-2247-8
