DocumentCode
583790
Title
Determination of energy deposition as a function of high atomic number material depth using the 225 W Pulserad
Author
Angles, M. ; Angles, J.M.
Author_Institution
Direction des Recherches, Etudes et Techniques, Centre d´´Etudes de Gramat 46500 Gramat - France
fYear
1981
fDate
June 29 1981-July 3 1981
Firstpage
489
Lastpage
496
Abstract
For fluence greater than 105 ca1/cm2, a multi-layered or filtered Faraday cup for time-integrated charge deposition profile measurements has been utilized on 225 W Pulserad. The effect of reflected electrons on diode behavior has been examined and found to be non-negligible for certain target configurations. Graphite, copper and tantalum targets have been used. By adjusting the mean angle of incidence and albedo in a Monte Carlo computer code, we calculate transmission curves which suit the best possible experimental results. Then, these parameters are used in energy deposition determinations.
Keywords
Computers; Copper; Materials; Monte Carlo methods; Temperature measurement; Thickness measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
High-Power Electron and Ion Beam Research & Technology, 1981 4th International Topical Conference on
Conference_Location
Palaiseau, France
Print_ISBN
000-0-0000-0000-0
Type
conf
Filename
6393654
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