• DocumentCode
    583790
  • Title

    Determination of energy deposition as a function of high atomic number material depth using the 225 W Pulserad

  • Author

    Angles, M. ; Angles, J.M.

  • Author_Institution
    Direction des Recherches, Etudes et Techniques, Centre d´´Etudes de Gramat 46500 Gramat - France
  • fYear
    1981
  • fDate
    June 29 1981-July 3 1981
  • Firstpage
    489
  • Lastpage
    496
  • Abstract
    For fluence greater than 105 ca1/cm2, a multi-layered or filtered Faraday cup for time-integrated charge deposition profile measurements has been utilized on 225 W Pulserad. The effect of reflected electrons on diode behavior has been examined and found to be non-negligible for certain target configurations. Graphite, copper and tantalum targets have been used. By adjusting the mean angle of incidence and albedo in a Monte Carlo computer code, we calculate transmission curves which suit the best possible experimental results. Then, these parameters are used in energy deposition determinations.
  • Keywords
    Computers; Copper; Materials; Monte Carlo methods; Temperature measurement; Thickness measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Power Electron and Ion Beam Research & Technology, 1981 4th International Topical Conference on
  • Conference_Location
    Palaiseau, France
  • Print_ISBN
    000-0-0000-0000-0
  • Type

    conf

  • Filename
    6393654