DocumentCode :
583843
Title :
A time resolved beam profile monitor for intense ion beams
Author :
Blaugrund, A.E. ; Stephanakis, S.J. ; Goldstein, Shyke A.
Author_Institution :
Naval Research Laboratory, Washington, D.C. 20375
fYear :
1981
fDate :
June 29 1981-July 3 1981
Firstpage :
955
Lastpage :
962
Abstract :
An intense ion beam profile monitor employing scintillators and fast photography has been developed. The ion flux reaching the scintillator is reduced by means of Rutherford scattering. Time resolved measurements of the distribution and direction of motion of ion beams as intense as IMA/cm2 can be made with this diagnostic method. Examples of measurements are presented.
Keywords :
Apertures; Focusing; Geometry; Ion beams; Reflection; Scattering; Spatial resolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High-Power Electron and Ion Beam Research & Technology, 1981 4th International Topical Conference on
Conference_Location :
Palaiseau, France
Print_ISBN :
000-0-0000-0000-0
Type :
conf
Filename :
6393711
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=583843
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