• DocumentCode
    583843
  • Title

    A time resolved beam profile monitor for intense ion beams

  • Author

    Blaugrund, A.E. ; Stephanakis, S.J. ; Goldstein, Shyke A.

  • Author_Institution
    Naval Research Laboratory, Washington, D.C. 20375
  • fYear
    1981
  • fDate
    June 29 1981-July 3 1981
  • Firstpage
    955
  • Lastpage
    962
  • Abstract
    An intense ion beam profile monitor employing scintillators and fast photography has been developed. The ion flux reaching the scintillator is reduced by means of Rutherford scattering. Time resolved measurements of the distribution and direction of motion of ion beams as intense as IMA/cm2 can be made with this diagnostic method. Examples of measurements are presented.
  • Keywords
    Apertures; Focusing; Geometry; Ion beams; Reflection; Scattering; Spatial resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Power Electron and Ion Beam Research & Technology, 1981 4th International Topical Conference on
  • Conference_Location
    Palaiseau, France
  • Print_ISBN
    000-0-0000-0000-0
  • Type

    conf

  • Filename
    6393711
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=583843