DocumentCode
584250
Title
A New Look Ahead Technique for Customized Testing in Digital Microfluidic Biochips
Author
Roy, Pranab ; Rahaman, Hafizur ; Dasgupta, Parthasarthi ; Bhattacharya, Bhargab B B
Author_Institution
Sch. of VLSI Technol., Bengal Eng. & Sci. Univ., Shibpur, India
fYear
2012
fDate
19-22 Nov. 2012
Firstpage
25
Lastpage
30
Abstract
Digital Micro fluidic biochips have been developed as a promising platform for Lab-on-chip systems that manipulate individual droplet of chemicals on a 2D planar array of electrodes. Due to the significance of the correctness of the results -- fault tolerance and dependability becomes a major issue for operation of these devices. Therefore, such devices are required to be tested frequently both off-line (e.g., post manufacturing) and concurrently ahead of each assay execution. Under both scenarios, testing is accomplished by routing one or more test droplets across the chip simultaneously and recording their arrival at the destination. In this paper we attempted to solve the problem of customized testing for a given Bioassay layout. We have applied a look ahead strategy for parallel testing using multiple droplets for any given test bench with an objective of minimization of test completion time and optimized utilization of test resources. The test simulations are carried out on test benches of Benchmark suite III and results obtained are found to be encouraging.
Keywords
biomedical electronics; electrodes; fault tolerance; integrated circuit reliability; lab-on-a-chip; microfluidics; 2D planar array; Benchmark suite III; bioassay layout; chemical droplet manipulation; customized testing; dependability; digital microfluidic biochip; electrode; fault tolerance; lab-on-chip system; look ahead technique; parallel testing; test completion time minimization; test resource utilization; Arrays; Circuit faults; Electrodes; Microfluidics; Routing; Schedules; Testing; Digital microfluidic biochips; Look ahead testing; completion time; resource utilization; routing algorithms; structural test;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2012 IEEE 21st Asian
Conference_Location
Niigata
ISSN
1081-7735
Print_ISBN
978-1-4673-4555-2
Electronic_ISBN
1081-7735
Type
conf
DOI
10.1109/ATS.2012.51
Filename
6394166
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