• DocumentCode
    584250
  • Title

    A New Look Ahead Technique for Customized Testing in Digital Microfluidic Biochips

  • Author

    Roy, Pranab ; Rahaman, Hafizur ; Dasgupta, Parthasarthi ; Bhattacharya, Bhargab B B

  • Author_Institution
    Sch. of VLSI Technol., Bengal Eng. & Sci. Univ., Shibpur, India
  • fYear
    2012
  • fDate
    19-22 Nov. 2012
  • Firstpage
    25
  • Lastpage
    30
  • Abstract
    Digital Micro fluidic biochips have been developed as a promising platform for Lab-on-chip systems that manipulate individual droplet of chemicals on a 2D planar array of electrodes. Due to the significance of the correctness of the results -- fault tolerance and dependability becomes a major issue for operation of these devices. Therefore, such devices are required to be tested frequently both off-line (e.g., post manufacturing) and concurrently ahead of each assay execution. Under both scenarios, testing is accomplished by routing one or more test droplets across the chip simultaneously and recording their arrival at the destination. In this paper we attempted to solve the problem of customized testing for a given Bioassay layout. We have applied a look ahead strategy for parallel testing using multiple droplets for any given test bench with an objective of minimization of test completion time and optimized utilization of test resources. The test simulations are carried out on test benches of Benchmark suite III and results obtained are found to be encouraging.
  • Keywords
    biomedical electronics; electrodes; fault tolerance; integrated circuit reliability; lab-on-a-chip; microfluidics; 2D planar array; Benchmark suite III; bioassay layout; chemical droplet manipulation; customized testing; dependability; digital microfluidic biochip; electrode; fault tolerance; lab-on-chip system; look ahead technique; parallel testing; test completion time minimization; test resource utilization; Arrays; Circuit faults; Electrodes; Microfluidics; Routing; Schedules; Testing; Digital microfluidic biochips; Look ahead testing; completion time; resource utilization; routing algorithms; structural test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2012 IEEE 21st Asian
  • Conference_Location
    Niigata
  • ISSN
    1081-7735
  • Print_ISBN
    978-1-4673-4555-2
  • Electronic_ISBN
    1081-7735
  • Type

    conf

  • DOI
    10.1109/ATS.2012.51
  • Filename
    6394166