• DocumentCode
    584266
  • Title

    Adaptive Board-Level Functional Fault Diagnosis Using Decision Trees

  • Author

    Ye, Fangming ; Zhang, Zhaobo ; Chakrabarty, Krishnendu ; Gu, Xinli

  • Author_Institution
    ECE Dept., Duke Univ., Durham, NC, USA
  • fYear
    2012
  • fDate
    19-22 Nov. 2012
  • Firstpage
    202
  • Lastpage
    207
  • Abstract
    Functional fault diagnosis at board-level is desirable for high-volume production since it improves product yield. However, to ensure diagnosis accuracy and effective board repair, a large number of syndromes must be used. Therefore, the diagnosis cost can be prohibitively high due to the increase in diagnosis time and the complexity of syndrome collection/analysis. We propose an adaptive diagnosis method based on decision trees (DTs). Faulty components are classified according to the discriminative ability of the syndromes in DT training. The diagnosis procedure is constructed as a binary tree, with the most discriminative syndrome as the root and final repair suggestions are available as the leaf nodes of the tree. The syndrome to be collected in the next step is determined based on the observations of syndromes collected thus far in the diagnosis procedure. The number of syndromes required for diagnosis can also be significantly reduced compared to the number of syndromes used for system training. Diagnosis results for two complex boards from industry, currently in volume production, and additional synthetic data highlight the effectiveness of the proposed approach.
  • Keywords
    decision trees; fault diagnosis; fault trees; adaptive board level functional fault diagnosis; binary tree; board repair; decision trees; diagnosis accuracy; diagnosis cost; diagnosis procedure; diagnosis time; discriminative syndrome; faulty component; high volume production; product yield; syndrome analysis; syndrome collection; Accuracy; Decision trees; Fault diagnosis; Indexes; Maintenance engineering; Manufacturing; Training; adaptive testing; board-level diagnosis; decision tree; functional failure; machine learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2012 IEEE 21st Asian
  • Conference_Location
    Niigata
  • ISSN
    1081-7735
  • Print_ISBN
    978-1-4673-4555-2
  • Electronic_ISBN
    1081-7735
  • Type

    conf

  • DOI
    10.1109/ATS.2012.48
  • Filename
    6394200