Title :
Why and How Controlling Power Consumption during Test: A Survey
Author :
Bosio, A. ; Dilillo, L. ; Girard, P. ; Todri, A. ; Virazel, A.
Author_Institution :
LIRMM, Univ. Montpellier 2, Montpellier, France
Abstract :
Managing the power consumption of circuits and systems is challenging not only during functional operations but also during manufacturing test. In this paper, we first explain why it is important to control power consumption during test application. We will introduce the basic concepts and discuss issues arising from excessive power dissipation during test. Then, we explain how it is possible to control power consumption during test. We will provide an overview of existing structural and algorithmic solutions for power-aware testing, and we will show how low power circuits can be tested safely without affecting yield and reliability.
Keywords :
circuit testing; low-power electronics; power consumption; power control; power supply circuits; algorithmic solution; circuit power consumption management; excessive power dissipation; low power circuit; manufacturing test; power aware testing; power consumption control; test application; Automatic test pattern generation; Clocks; Logic gates; Power demand; Power dissipation; Switches;
Conference_Titel :
Test Symposium (ATS), 2012 IEEE 21st Asian
Conference_Location :
Niigata
Print_ISBN :
978-1-4673-4555-2
Electronic_ISBN :
1081-7735
DOI :
10.1109/ATS.2012.30