DocumentCode :
585240
Title :
Exact analytical analysis of via-coupling in multiple-layer structures
Author :
Friedrich, M. ; Leone, M.
Author_Institution :
Dept. of Theor. Electr. Eng., OvG-Univ. Magdeburg, Magdeburg, Germany
fYear :
2012
fDate :
17-21 Sept. 2012
Firstpage :
1
Lastpage :
5
Abstract :
An efficient analysis of the capacitive via-plate coupling in multilayer printed-circuit board (PCB) structures is presented. The quasistatic solution for the via-plate capacitance is determined as the solution of Laplace´s equation for the static electric potential within the via-plate region, which is electrically small for a large frequency range. The final capacitance solution can be obtained by one single coefficient of the resulting linear equation system. The influence of additional via pads is readily included. An appropriate multiport equivalent circuit is set up by combination with the cavity impedances of the parallel-plane pairs. For frequencies where the whole structure is electrically small the model can be simplified to an equivalent circuit with coupled port inductances. The results are validated by 3D full-wave numerical simulations and measurements results.
Keywords :
Laplace equations; equivalent circuits; integrated circuit interconnections; printed circuits; 3D full-wave numerical simulations; Laplace equation; analytical analysis; capacitive via-plate coupling; cavity impedances; coupled port inductances; linear equation system; multilayer printed circuit board; multiple-layer structures; multiport equivalent circuit; static electric potential; via-pad capacitance; via-plate capacitance; Capacitance; Cavity resonators; Couplings; Equations; Integrated circuit modeling; Mathematical model; power integrity; signal-integrity; via-barrel capacitance; via-pad capacitance; via-plate capacitance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on
Conference_Location :
Rome
ISSN :
2325-0356
Print_ISBN :
978-1-4673-0718-5
Type :
conf
DOI :
10.1109/EMCEurope.2012.6396672
Filename :
6396672
Link To Document :
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