Title :
Complex near electromagnetic field scanning on printed circuit board
Author :
Xiao, Fengchao ; Takatsu, Toshihiro ; Murano, Kimitoshi ; Kami, Yoshio
Author_Institution :
Dept. of Commun. Eng. & Inf., Univ. of Electro-Commun., Chofu, Japan
Abstract :
In this paper, a new measurement system for scanning the complex near field on a printed circuit board (PCB) is proposed. The measurement is based on the 6-port technique. The measurement results of the proposed measurement system and the measured results directly by using a VNA agree well, which confirmed the validity of the proposed measurement system.
Keywords :
electromagnetic fields; measurement systems; printed circuits; 6-port technique; PCB; VNA; complex near electromagnetic field scanning; measurement system; printed circuit board; Impedance; Magnetic field measurement; Phase measurement; Power measurement; Probes; Voltage measurement; 6-port network; Quadrature hybrid; near EM-field; phase measurement;
Conference_Titel :
Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on
Conference_Location :
Rome
Print_ISBN :
978-1-4673-0718-5
DOI :
10.1109/EMCEurope.2012.6396675
