Black-box modelling of conducted electromagnetic immunity by support vector machines

Author

Ceperic, Vladimir ; Gielen, Georges ; Baric, Adrijan

Author_Institution

FER, Univ. of Zagreb, Zagreb, Croatia

fYear

2012

fDate

17-21 Sept. 2012

Firstpage

1

Lastpage

6

Abstract

A concept of modelling electromagnetic immunity (EMI) of integrated circuits (IC) by using support vector machines (SVM) is presented. The problem of detecting, modelling and predicting failure of the integrated circuit operation due to the conducted electromagnetic interferences according to IEC 62132-4 standard is transformed into the classification problem solved by SVM. As a electronic circuit test case, the conducted EMI model of local interconnect network (LIN) interface circuit is presented.

Keywords

IEC standards; computational electromagnetics; electromagnetic interference; electronic engineering computing; failure analysis; integrated circuit interconnections; integrated circuit modelling; integrated circuit reliability; integrated circuit testing; network interfaces; support vector machines; EMI model; IC; IEC 62132-4 standard; LIN interface circuit; SVM; black-box modelling; classification problem; conducted electromagnetic immunity; conducted electromagnetic interference; electromagnetic immunity modelling; electronic circuit test case; failure detection; failure modelling; failure prediction; integrated circuit operation; local interconnect network interface circuit; support vector machine; Data models; Electromagnetic interference; Electromagnetics; Integrated circuit modeling; Support vector machines; Training data; Vectors;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on

Conference_Location

Rome

ISSN

2325-0356

Print_ISBN

978-1-4673-0718-5

Type

conf

DOI

10.1109/EMCEurope.2012.6396693

Filename

6396693