Title :
Simulation method for automotive electronic equipment immunity testing
Author :
Oguri, Y. ; Ichikawa, Kazuhisa
Author_Institution :
Eng. R&D Center, Denso Corp., Kariya, Japan
Abstract :
Since safety is critical for automotive electronics devices, severe immunity tests are applied, then automotive component suppliers have to spend time in design and testing. Using simulation is one of key to realize effective design and testing, however, conventional simulation techniques do not enable the designer to predict malfunction frequencies despite that they are important for devising solutions. This paper proposes a simulation technique for predicting malfunction frequencies, noticing the transmission level of applied noise. Using this technique, we verified that simulation results well agreed with measurement results for frequencies up to 200 MHz.
Keywords :
automotive electronics; immunity testing; safety systems; applied noise; automotive component suppliers; automotive electronic equipment; critical safety; immunity testing; malfunction frequency prediction; transmission level; Automotive engineering; Current measurement; Frequency measurement; Immunity testing; Impedance; Integrated circuit modeling; Radio frequency; BCI; DPI; modeling; radiated immunity;
Conference_Titel :
Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on
Conference_Location :
Rome
Print_ISBN :
978-1-4673-0718-5
DOI :
10.1109/EMCEurope.2012.6396710