DocumentCode :
585262
Title :
Simulation method for automotive electronic equipment immunity testing
Author :
Oguri, Y. ; Ichikawa, Kazuhisa
Author_Institution :
Eng. R&D Center, Denso Corp., Kariya, Japan
fYear :
2012
fDate :
17-21 Sept. 2012
Firstpage :
1
Lastpage :
6
Abstract :
Since safety is critical for automotive electronics devices, severe immunity tests are applied, then automotive component suppliers have to spend time in design and testing. Using simulation is one of key to realize effective design and testing, however, conventional simulation techniques do not enable the designer to predict malfunction frequencies despite that they are important for devising solutions. This paper proposes a simulation technique for predicting malfunction frequencies, noticing the transmission level of applied noise. Using this technique, we verified that simulation results well agreed with measurement results for frequencies up to 200 MHz.
Keywords :
automotive electronics; immunity testing; safety systems; applied noise; automotive component suppliers; automotive electronic equipment; critical safety; immunity testing; malfunction frequency prediction; transmission level; Automotive engineering; Current measurement; Frequency measurement; Immunity testing; Impedance; Integrated circuit modeling; Radio frequency; BCI; DPI; modeling; radiated immunity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on
Conference_Location :
Rome
ISSN :
2325-0356
Print_ISBN :
978-1-4673-0718-5
Type :
conf
DOI :
10.1109/EMCEurope.2012.6396710
Filename :
6396710
Link To Document :
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