Non-linear 3-D simulations for system level ESD threat evaluation

ESD sensitivity of components on system level is one of the key EMC risks in hand held devices. However, it is often very difficult to estimate what are the causes and effects from the pass or fail type results of the system level ESD tests. Additionally, these can be performed only when physical samples are available. Here non-linear 3-D ESD simulations are used to evaluate the root causes and estimate risks before actual prototypes are built. Also the physical samples are tested and good correspondence is found but only qualitative pass/fail measurement results can be presented here. It is shown that simulations can yield early on risk indications.