DocumentCode :
585347
Title :
Radiated immunity testing of integrated circuits in reverberation chambers
Author :
Heinrich, Ralf ; Bechly, Robert ; Deutschmann, Bernd
Author_Institution :
Teseq GmbH, Berlin, Germany
fYear :
2012
fDate :
17-21 Sept. 2012
Firstpage :
1
Lastpage :
4
Abstract :
Radiated immunity testing of integrated circuits in the higher frequency range above 1 GHz is characterized by several challenges, e.g the required high field strengths and a rising influence of the EUT orientation. The existing methods show various limitations in this respect. Due to its entirely different principle of operation the reverberation chamber provides an opportunity to overcome the drawbacks of existing methods in the higher frequency range.
Keywords :
immunity testing; integrated circuit testing; reverberation chambers; EUT orientation; high field strength; integrated circuit testing; radiated immunity testing; reverberation chamber; Antenna radiation patterns; Immunity testing; Integrated circuits; Reverberation chamber; TEM cells; EMC; emission; immunity; integrated circuits; reverberation chamber;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on
Conference_Location :
Rome
ISSN :
2325-0356
Print_ISBN :
978-1-4673-0718-5
Type :
conf
DOI :
10.1109/EMCEurope.2012.6396877
Filename :
6396877
Link To Document :
بازگشت