Title :
Radiated immunity testing of integrated circuits in reverberation chambers
Author :
Heinrich, Ralf ; Bechly, Robert ; Deutschmann, Bernd
Author_Institution :
Teseq GmbH, Berlin, Germany
Abstract :
Radiated immunity testing of integrated circuits in the higher frequency range above 1 GHz is characterized by several challenges, e.g the required high field strengths and a rising influence of the EUT orientation. The existing methods show various limitations in this respect. Due to its entirely different principle of operation the reverberation chamber provides an opportunity to overcome the drawbacks of existing methods in the higher frequency range.
Keywords :
immunity testing; integrated circuit testing; reverberation chambers; EUT orientation; high field strength; integrated circuit testing; radiated immunity testing; reverberation chamber; Antenna radiation patterns; Immunity testing; Integrated circuits; Reverberation chamber; TEM cells; EMC; emission; immunity; integrated circuits; reverberation chamber;
Conference_Titel :
Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on
Conference_Location :
Rome
Print_ISBN :
978-1-4673-0718-5
DOI :
10.1109/EMCEurope.2012.6396877