DocumentCode :
58555
Title :
A \\Delta \\Sigma Interface for MEMS Accelerometers Using Electrostatic Spring Constant Modulation for Cancellation of Bondwire Capacitance Drift
Author :
Lajevardi, Pedram ; Petkov, V.P. ; Murmann, Boris
Author_Institution :
Bosch Res. & Technol. Center, Palo Alto, CA, USA
Volume :
48
Issue :
1
fYear :
2013
fDate :
Jan. 2013
Firstpage :
265
Lastpage :
275
Abstract :
This paper presents a closed-loop accelerometer interface based on a force-feedback ΔΣ loop. The interface reduces the offset, and its drift, arising from asymmetry in the parasitic capacitances of the bondwires connecting the CMOS interface IC and the MEMS sensor element. This is achieved by modulating the spring constant of the sensor electrostatically and continuously measuring and nulling the offset via an offset cancellation loop. In a bondwire deformation experiment, we show that the offset cancellation loop reduces an induced offset of 350 mg by 54 dB down to 0.7 mg. The interface was fabricated in a 0.18-μm CMOS technology. The active circuit area is 1.35 mm2 and the interface consumes 3.1 mW from a 3-V supply, while achieving a noise floor of 220 μg/√Hz over a 1-kHz bandwidth. When the offset cancellation loop is turned on the bandwidth available for the signal is 200 Hz.
Keywords :
CMOS integrated circuits; accelerometers; delta-sigma modulation; electrostatic devices; microsensors; ΔΣ interface; CMOS interface IC; CMOS technology; MEMS accelerometers; MEMS sensor element; bandwidth 1 kHz; bandwidth 200 Hz; bondwire capacitance drift cancellation; bondwire deformation experiment; closed-loop accelerometer interface; electrostatic spring constant modulation; force-feedback ΔΣ loop; offset cancellation loop; power 3.1 mW; size 0.18 mum; voltage 3 V; Accelerometers; Capacitors; Electrostatics; Force; Micromechanical devices; Modulation; Springs; Accelerometer; Delta Sigma ($Delta Sigma$ ); MEMS; force feedback; inertial sensor; offset cancellation; spring constant modulation;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2012.2218721
Filename :
6334424
Link To Document :
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