• DocumentCode
    585793
  • Title

    A better-than-worst-case circuit design methodology using timing-error speculation and frequency adaptation

  • Author

    Londoño, Sebastian Moreno ; De Gyvez, José Pineda

  • Author_Institution
    Eindhoven Univ. of Technol., Eindhoven, Netherlands
  • fYear
    2012
  • fDate
    12-14 Sept. 2012
  • Firstpage
    15
  • Lastpage
    20
  • Abstract
    Digital circuits have been traditionally designed to meet the worst PVT conditions to guarantee high yield. This design methodology produces an integrated circuit which has a big overhead in terms of area and power consumption in most of the cases. In this paper, a new better-than-worst-case-design methodology is proposed. It is based on a timing error speculation technique which features simple monitors located in the critical paths of the circuit that will speculate whether a timing error is going to occur or not. Using a 32-bit multiplier, this design methodology achieved area and power savings up to 50%, with 5% performance loss.
  • Keywords
    integrated circuit design; logic design; multiplying circuits; power consumption; PVT condition; better-than-worst-case circuit design methodology; circuit critical path; digital circuit design; frequency adaptation; integrated circuit; multiplier; power consumption; power saving; timing-error speculation; word length 32 bit; Clocks; Delay; Integrated circuits; Monitoring; Optical wavelength conversion; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOC Conference (SOCC), 2012 IEEE International
  • Conference_Location
    Niagara Falls, NY
  • ISSN
    2164-1676
  • Print_ISBN
    978-1-4673-1294-3
  • Type

    conf

  • DOI
    10.1109/SOCC.2012.6398370
  • Filename
    6398370