DocumentCode
585793
Title
A better-than-worst-case circuit design methodology using timing-error speculation and frequency adaptation
Author
Londoño, Sebastian Moreno ; De Gyvez, José Pineda
Author_Institution
Eindhoven Univ. of Technol., Eindhoven, Netherlands
fYear
2012
fDate
12-14 Sept. 2012
Firstpage
15
Lastpage
20
Abstract
Digital circuits have been traditionally designed to meet the worst PVT conditions to guarantee high yield. This design methodology produces an integrated circuit which has a big overhead in terms of area and power consumption in most of the cases. In this paper, a new better-than-worst-case-design methodology is proposed. It is based on a timing error speculation technique which features simple monitors located in the critical paths of the circuit that will speculate whether a timing error is going to occur or not. Using a 32-bit multiplier, this design methodology achieved area and power savings up to 50%, with 5% performance loss.
Keywords
integrated circuit design; logic design; multiplying circuits; power consumption; PVT condition; better-than-worst-case circuit design methodology; circuit critical path; digital circuit design; frequency adaptation; integrated circuit; multiplier; power consumption; power saving; timing-error speculation; word length 32 bit; Clocks; Delay; Integrated circuits; Monitoring; Optical wavelength conversion; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
SOC Conference (SOCC), 2012 IEEE International
Conference_Location
Niagara Falls, NY
ISSN
2164-1676
Print_ISBN
978-1-4673-1294-3
Type
conf
DOI
10.1109/SOCC.2012.6398370
Filename
6398370
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