DocumentCode :
585793
Title :
A better-than-worst-case circuit design methodology using timing-error speculation and frequency adaptation
Author :
Londoño, Sebastian Moreno ; De Gyvez, José Pineda
Author_Institution :
Eindhoven Univ. of Technol., Eindhoven, Netherlands
fYear :
2012
fDate :
12-14 Sept. 2012
Firstpage :
15
Lastpage :
20
Abstract :
Digital circuits have been traditionally designed to meet the worst PVT conditions to guarantee high yield. This design methodology produces an integrated circuit which has a big overhead in terms of area and power consumption in most of the cases. In this paper, a new better-than-worst-case-design methodology is proposed. It is based on a timing error speculation technique which features simple monitors located in the critical paths of the circuit that will speculate whether a timing error is going to occur or not. Using a 32-bit multiplier, this design methodology achieved area and power savings up to 50%, with 5% performance loss.
Keywords :
integrated circuit design; logic design; multiplying circuits; power consumption; PVT condition; better-than-worst-case circuit design methodology; circuit critical path; digital circuit design; frequency adaptation; integrated circuit; multiplier; power consumption; power saving; timing-error speculation; word length 32 bit; Clocks; Delay; Integrated circuits; Monitoring; Optical wavelength conversion; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOC Conference (SOCC), 2012 IEEE International
Conference_Location :
Niagara Falls, NY
ISSN :
2164-1676
Print_ISBN :
978-1-4673-1294-3
Type :
conf
DOI :
10.1109/SOCC.2012.6398370
Filename :
6398370
Link To Document :
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