• DocumentCode
    586497
  • Title

    Matrix-based visual correlation analysis on large timeseries data

  • Author

    Behrisch, M. ; Davey, Jay ; Schreck, Tobias ; Keim, Daniel ; Kohlhammer, Jorn

  • fYear
    2012
  • fDate
    14-19 Oct. 2012
  • Firstpage
    209
  • Lastpage
    210
  • Abstract
    In recent years, the quantity of time series data generated in a wide variety of domains grown consistently. Thus, it is difficult for analysts to process and understand this overwhelming amount of data. In the specific case of time series data another problem arises: time series can be highly interrelated. This problem becomes even more challenging when a set of parameters influences the progression of a time series. However, while most visual analysis techniques support the analysis of short time periods, e.g. one day or one week, they fail to visualize large-scale time series, ranging over one year or more. In our approach we present a time series matrix visualization that tackles this problem. Its primary advantages are that it scales to a large number of time series with different start and end points and allows for the visual comparison / correlation analysis of a set of influencing factors. To evaluate our approach, we applied our technique to a real-world data set, showing the impact of local weather conditions on the efficiency of photovoltaic power plants.
  • Keywords
    data visualisation; matrix algebra; time series; local weather conditions; matrix-based visual correlation analysis; photovoltaic power plant efficiency; time series data generation quantity; time series matrix data visualization; visual analysis techniques; visual comparison analysis; visual correlation analysis; Correlation; Meteorology; Power generation; Substations; Temperature measurement; Time series analysis; Visualization; H.3.3 [Information Search and Retrieval Design Tools and Techniques]: Information filtering —;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Visual Analytics Science and Technology (VAST), 2012 IEEE Conference on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4673-4752-5
  • Type

    conf

  • DOI
    10.1109/VAST.2012.6400549
  • Filename
    6400549