DocumentCode :
586850
Title :
Laboratory test bench demonstrating smart load shedding schemes
Author :
Milhau, D. ; Mollah, K. ; Nair, Nirmal-Kumar C.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Auckland, Auckland, New Zealand
fYear :
2012
fDate :
Oct. 30 2012-Nov. 2 2012
Firstpage :
1
Lastpage :
6
Abstract :
Increasing electricity consumption, ageing of electricity infrastructures, utilization of networks at maximum limits are all issues that impact current utility practices and add to its operational challenges. An option looked into is intelligent networks (Smart Grids) to address these challenges in a coherent manner. Consequently, the increasing integration and the penetration of intelligent technologies in the distribution networks appear unavoidable. This paper presents the design and developments of a smart load shedding test bench to help facilitate the understanding of substation automation (SA). This setup uses protection intelligent electronic devices (IEDs) that support IEC 61850 protocol, universal secondary test gear for relays, a protocol converter that can be programmed and can handle a large number of power system automation protocols. In this paper the retrofitting of the latest relay IEDs with the existing control center software has been demonstrated. Finally, a method using fuzzy logic is illustrated for implementing priority based automatic under voltage load shedding (AUVLS) policy.
Keywords :
ageing; distribution networks; intelligent networks; load regulation; power consumption; smart power grids; substation automation; IEC 61850 protocol; automatic under voltage load shedding policy; control center software; distribution networks; electricity consumption; electricity infrastructures ageing; fuzzy logic; intelligent electronic devices; intelligent networks; laboratory test bench; networks utilization; power system automation protocols; protocol converter; smart grids; smart load shedding schemes; smart load shedding test bench; substation automation; universal secondary test gear; Artificial neural networks; Automation; IEEE Lasers and Electro-Optics Society; Monitoring; Substations; Load control; intelligent Electronic devices (IEDs); laboratory; loads shedding; protocol; under-voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power System Technology (POWERCON), 2012 IEEE International Conference on
Conference_Location :
Auckland
Print_ISBN :
978-1-4673-2868-5
Type :
conf
DOI :
10.1109/PowerCon.2012.6401469
Filename :
6401469
Link To Document :
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