Title :
On-die instrumentation to solve challenges for 28nm, 28Gbps timing variability and stressing
Author :
Weichi Ding ; Mingde Pan ; Wong, Wing Kee ; Chow, Derek ; Li, Mike Peng ; Shumarayev, S.
Author_Institution :
Altera Corp., San Jose, CA, USA
Abstract :
Moving to the latest submicron node is required for digital scaling but causes many challenges for analog design. Additionally, scaling pushes the need for higher bandwidth. Data rates up to 28Gbps require effectively dealing with random variations and layout dependent effects. On-die instrumentation (ODI) is an effective means to alleviate many of the challenges, as well as characterize and margin performance. This paper covers two of the ODI techniques used in the design of a wide range 28nm, 28Gbps transceiver.
Keywords :
analogue circuits; instrumentation; transceivers; analog design; bit rate 28 Gbit/s; digital scaling; layout dependent effect; on die instrumentation; random variation; size 28 nm; submicron node; timing variability; transceiver; Calibration; Clocks; Jitter; Receivers; Transistors; Transmitters; Voltage-controlled oscillators;
Conference_Titel :
Test Conference (ITC), 2012 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4673-1594-4
DOI :
10.1109/TEST.2012.6401536
