Title :
A digital method for phase noise measurement
Author :
Ecker, Allan ; Blakkan, K. ; Soma, Mani
Author_Institution :
Univ. of Washington, Seattle, WA, USA
Abstract :
To reduce the test costs of phase noise measurements, we use all-digital methods to detect sinusoidal phase noise components while reducing the need for computation intensive FFT.
Keywords :
noise measurement; phase noise; all-digital methods; computation intensive FFT reduction; phase noise measurements; sinusoidal phase noise components detection; test costs reduction; Frequency domain analysis; Jitter; Noise measurement; Phase measurement; Phase noise; Time domain analysis;
Conference_Titel :
Test Conference (ITC), 2012 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4673-1594-4
DOI :
10.1109/TEST.2012.6401537
