• DocumentCode
    586867
  • Title

    Low-cost wideband periodic signal reconstruction using incoherent undersampling and back-end cost optimization

  • Author

    Tzou, Nicholas ; Bhatta, Debesh ; Sen-Wen Hsiao ; Hyun Woo Choi ; Chatterjee, Avhishek

  • fYear
    2012
  • fDate
    5-8 Nov. 2012
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Acquisition of wide bandwidth signals is a significant problem in manufacturing test due to the cost of test equipment driven by the use of high-speed sample and hold circuitry and difficulty in data-clock synchronization. We propose to combine frequency interleaved down conversion (to overcome the bandwidth limitations of sample and hold circuitry) with incoherent undersampling (to overcome data-clock synchronization and ADC speed issues) to design a low cost instrumentation for high speed signal capture. A novel signal reconstruction algorithm is developed along with a method for calibrating the effects of unknown delays in data acquisition hardware due to mismatch in signal path lengths on the reconstructed signal. Simulation results and preliminary hardware validation prove the feasibility of the proposed technique.
  • Keywords
    data acquisition; instrumentation; sample and hold circuits; signal reconstruction; ADC speed issues; back-end cost optimization; data acquisition hardware; data-clock synchronization; frequency interleaved down conversion; high speed signal capture; incoherent undersampling; instrumentation design; low-cost wideband periodic signal reconstruction; manufacturing test; preliminary hardware validation; sample and hold circuitry; signal path lengths; test equipment; wide bandwidth signal acquisition; Bandwidth; Delay; Estimation; Frequency conversion; Frequency estimation; Hardware; Nonlinear distortion; Incoherent Sampling; Periodic Signal; Signal Down-Mixing; Signal Reconstruction; Total Variation Minimization; Under Sampling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2012 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4673-1594-4
  • Type

    conf

  • DOI
    10.1109/TEST.2012.6401552
  • Filename
    6401552