DocumentCode :
586871
Title :
Improving test compression by retaining non-pivot free variables in sequential linear decompressors
Author :
Muthyala, Sreenivaas S. ; Touba, Nur A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Texas, Austin, TX, USA
fYear :
2012
fDate :
5-8 Nov. 2012
Firstpage :
1
Lastpage :
7
Abstract :
Sequential linear decompressors are inherently efficient and attractive for compressing test cubes with many don´t cares. The test cubes are encoded by solving a system of linear equations. In continuous decompression, typically a fixed number of free variables are used to encode each test cube in a “one-size-fits-all” manner. The non-pivot free variables used in Gaussian elimination are wasted when the decompressor is reset before decompressing the next test cube. This paper explores techniques for retaining the non-pivot free variables for a test cube and using them to help encode subsequent test cubes and hence improve encoding efficiency. This approach retains most of the non-pivot free variables with only a minimal increase in runtime for solving the equations and no added control information. Experimental results are presented showing that the encoding efficiency, and hence compression, can be significantly boosted.
Keywords :
circuit testing; data compression; Gaussian elimination; continuous decompression; encoding efficiency; linear equations; nonpivot free variables; sequential linear decompressors; test compression; test cube compression; Clocks; Conferences; Encoding; Equations; Hardware; Mathematical model; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference (ITC), 2012 IEEE International
Conference_Location :
Anaheim, CA
ISSN :
1089-3539
Print_ISBN :
978-1-4673-1594-4
Type :
conf
DOI :
10.1109/TEST.2012.6401557
Filename :
6401557
Link To Document :
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