Title :
FALCON: Rapid statistical fault coverage estimation for complex designs
Author :
Mirkhani, Shahrzad ; Abraham, J.A. ; Toai Vo ; Hongshin Jun ; Eklow, Bill
Author_Institution :
Comput. Eng. Res. Center, Univ. of Texas at Austin, Austin, TX, USA
Abstract :
FALCON (FAst fauLt COverage estimatioN) is a scalable method for fault grading which uses local fault simulations to estimate the fault coverage of a large system. The generality of this method makes it applicable for any modular design. Our analysis shows that the run time of our algorithm is related to the number of gates and the number of IOs in a module, while fault simulation run time is related to the total number of gates in the system. We have measured fault coverage for OR1200 and IVM processors and compared the results with fault simulation performed by a commercial tool. We have also compared our results with fault sampling. Our results show that for large designs FALCON is an order of magnitude faster compared with fault simulation. It also has a smaller error rate compared with fault sampling when the size of design under test grows.
Keywords :
fault simulation; microprocessor chips; FALCON; IVM processors; OR1200 processors; complex designs; fast fault coverage estimation; fault grading; fault sampling; fault simulation run time; local fault simulations; statistical fault coverage estimation; Circuit faults; Dictionaries; Estimation; Logic gates; Probability; Program processors; Vectors;
Conference_Titel :
Test Conference (ITC), 2012 IEEE International
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-4673-1594-4
DOI :
10.1109/TEST.2012.6401584