• DocumentCode
    586882
  • Title

    FALCON: Rapid statistical fault coverage estimation for complex designs

  • Author

    Mirkhani, Shahrzad ; Abraham, J.A. ; Toai Vo ; Hongshin Jun ; Eklow, Bill

  • Author_Institution
    Comput. Eng. Res. Center, Univ. of Texas at Austin, Austin, TX, USA
  • fYear
    2012
  • fDate
    5-8 Nov. 2012
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    FALCON (FAst fauLt COverage estimatioN) is a scalable method for fault grading which uses local fault simulations to estimate the fault coverage of a large system. The generality of this method makes it applicable for any modular design. Our analysis shows that the run time of our algorithm is related to the number of gates and the number of IOs in a module, while fault simulation run time is related to the total number of gates in the system. We have measured fault coverage for OR1200 and IVM processors and compared the results with fault simulation performed by a commercial tool. We have also compared our results with fault sampling. Our results show that for large designs FALCON is an order of magnitude faster compared with fault simulation. It also has a smaller error rate compared with fault sampling when the size of design under test grows.
  • Keywords
    fault simulation; microprocessor chips; FALCON; IVM processors; OR1200 processors; complex designs; fast fault coverage estimation; fault grading; fault sampling; fault simulation run time; local fault simulations; statistical fault coverage estimation; Circuit faults; Dictionaries; Estimation; Logic gates; Probability; Program processors; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2012 IEEE International
  • Conference_Location
    Anaheim, CA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4673-1594-4
  • Type

    conf

  • DOI
    10.1109/TEST.2012.6401584
  • Filename
    6401584