DocumentCode :
586886
Title :
Low cost high-speed test data acquisition: Accurate period estimation driven signal reconstruction using incoherent subsampling
Author :
Moon, Thomas ; Hyun Woo Choi ; Chatterjee, Avhishek
Author_Institution :
Sch. of ECE, Georgia Tech, Atlanta, GA, USA
fYear :
2012
fDate :
5-8 Nov. 2012
Firstpage :
1
Lastpage :
9
Abstract :
In this paper, we propose a new algorithm to estimate the fundamental period (frequency) of a highspeed pseudo random bit sequence (PRBS) or multitone signal using incoherent subsampling. While incoherent subsampling suffers from spectral leakage due to the mismatch between the input test signal and the discrete Fourier transform (DFT) basis, the proposed algorithm efficiently resolves the spectral leakage problem using a back-end signal process. The approach requires incoherent digitization of the periodic sequence using at least two clocks running at different speeds. No additional hardware to synchronize the input signal frequency with the sampling clock frequency is needed. A new discrete frequency shifting approach for determining the period of the input signal is proposed that is computationally efficient. The signal reconstruction approach has been tested with experimental results.
Keywords :
data acquisition; discrete Fourier transforms; frequency estimation; integrated circuit testing; random sequences; signal reconstruction; signal sampling; accurate period estimation; discrete Fourier transform; discrete frequency shifting; frequency estimation; fundamental period estimation; high-speed pseudorandom bit sequence; input signal frequency; low cost high speed test data acquisition; multitone signal using incoherent subsampling; sampling clock frequency; signal reconstruction; test signal; Clocks; Discrete Fourier transforms; Estimation; Frequency domain analysis; Frequency estimation; Interpolation; Signal processing algorithms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference (ITC), 2012 IEEE International
Conference_Location :
Anaheim, CA
ISSN :
1089-3539
Print_ISBN :
978-1-4673-1594-4
Type :
conf
DOI :
10.1109/TEST.2012.6401591
Filename :
6401591
Link To Document :
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