DocumentCode :
586897
Title :
Review on VCO based ADC in modern deep submicron CMOS technology
Author :
Hon Cheong Hor ; Siek, Liter
Author_Institution :
IC Design Centre of Excellence, Nanyang Technol. Univ., Singapore, Singapore
fYear :
2012
fDate :
21-23 Nov. 2012
Firstpage :
86
Lastpage :
88
Abstract :
The continuous scaling in CMOS technology has driven researchers to look for new ADC architecture that can work well in lower supply voltage and smaller device dimension. VCO-based ADCs have emerged as an attractive solution due to its highly digital intensive circuit architecture, inherent noise shaping characteristic, as well as anti-aliasing property. However, the nonlinear behavior of VCO´s voltage-to-frequency characteristic has severe limitation on the performance of VCO-based ADC. This paper presents recent development in VCO-based ADC with different VCO nonlinearity suppression techniques. The advantage and disadvantage of each of these techniques will be reviewed.
Keywords :
CMOS digital integrated circuits; analogue-digital conversion; voltage-controlled oscillators; VCO nonlinearity suppression technique; VCO voltage-to-frequency characteristic; VCO-based ADC architecture; antialiasing property; digital intensive circuit architecture; inherent noise shaping characteristic; modern deep submicron CMOS technology; nonlinear behavior; CMOS integrated circuits; CMOS technology; Calibration; Delay; Pulse width modulation; Sigma delta modulation; Voltage-controlled oscillators; Digital like ADC; VCO based ADC; all-digital ADC; time-mode ADC;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio-Frequency Integration Technology (RFIT), 2012 IEEE International Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-2303-1
Type :
conf
DOI :
10.1109/RFIT.2012.6401622
Filename :
6401622
Link To Document :
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