• DocumentCode
    587170
  • Title

    Characteristics of charge accumulation on coated electrode in SF6 gas

  • Author

    Kainaga, Soichiro ; Miyamoto, Takahiro ; Yoshimura, Masashi ; Tsurimoto, Takao

  • Author_Institution
    Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Amagasaki, Japan
  • fYear
    2012
  • fDate
    21-24 Oct. 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The SF6 gas insulation system has been improved by covering the electrode with a dielectric layer. To raise the reliability of this method, the authors evaluated the influence of charge accumulation of the coated electrode on the breakdown characteristics and directly measured the charge accumulation of the coated electrode. By measuring the breakdown voltage of the coated electrode with and without charge elimination, it became clear that charges on the coated electrode enlarge both the absolute value and the dispersion of the breakdown voltage. By measuring the surface potential, two results were obtained. First, when the electric field of the tip of the electrode exceeded the theoretical breakdown field of SF6 gas, the coated electrode was charged with the opposite polarity of the applied voltage. Second, the amount of the surface potential of the coated electrode varied depending on the polarity of the applied voltage and whether breakdown had occurred or not.
  • Keywords
    SF6 insulation; coatings; electric breakdown; electric fields; electrodes; gas insulated switchgear; surface potential; voltage measurement; SF6 gas insulation system; breakdown characteristics; breakdown voltage measurement; charge accumulation measurement; charge elimination; coated electrode; dielectric layer; dispersion; electric field; reliability; surface potential measurement; voltage polarity; Electric potential; Electrodes; Sulfur hexafluoride; Breakdown; Coated electrode; GIS; Surface potential;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Machines and Systems (ICEMS), 2012 15th International Conference on
  • Conference_Location
    Sapporo
  • Print_ISBN
    978-1-4673-2327-7
  • Type

    conf

  • Filename
    6401954