Title :
Sampling frequency influence at fault locations using algorithms based on artificial neural networks
Author :
Silva, J.A.C.B. ; Silva, K.M. ; Neves, W.L.A. ; Souza, Benemar A. ; Costa, F.B.
Author_Institution :
Fed. Inst. of Paraiba (IFPB), Fed. Univ. of Campina Grande (UFCG), Campina Grande, Brazil
Abstract :
A sampling frequency evaluation used in digital fault recorders for fault locations was implemented. A chained structure of artificial neural networks (ANN) was adopted to locate the faults. The ATP (Alternative Transient Program) software was used in the building of the database for training, testing and validation of the ANN, with different sampling frequencies. The input to the ANN are phase quantities and zero sequence voltage and current waveform data. The fault conditions were simulated for a 230 kV transmission line. The database used was generated automatically from a standard format file, and run in batch mode. For the fault location, the transmission line was divided into 8 zones. Previous to location, classification of the fault type is performed by training the ANN with the full line data. For the location, eight ANN were trained for each fault type, each one with the data of each zone.
Keywords :
fault location; learning (artificial intelligence); neural nets; oscillographs; power engineering computing; power transmission faults; power transmission lines; program testing; program verification; signal sampling; ANN testing; ANN training; ANN validation; ATP software; alternative transient program software; batch mode; chained artificial neural network structure; current waveform data; digital fault recorders; fault condition simulation; fault locations; fault type classification; phase quantities; sampling frequency evaluation; standard format file; transmission line; voltage 230 kV; zero-sequence voltage; Artificial neural networks; Databases; Fault location; Power transmission lines; Training; Digital Fault Recorders; Fault Location; Sampling Frequency;
Conference_Titel :
Nature and Biologically Inspired Computing (NaBIC), 2012 Fourth World Congress on
Conference_Location :
Mexico City
Print_ISBN :
978-1-4673-4767-9
DOI :
10.1109/NaBIC.2012.6402233