Title :
Phase behavior in serial and parallel applications
Author :
Sembrant, A. ; Black-Schaffer, D. ; Hagersten, Erik
Author_Institution :
Dept. of Inf. Technol., Uppsala Univ., Uppsala, Sweden
Abstract :
It is well known that most serial programs exhibit time varying behavior, for example, alternating between memory- and compute-bound phases. However, most research into program phase behavior has focused on the serial SPEC benchmark suite, with little investigations into large scale phase behavior in parallel applications. In this study we compare and examine the time-varying behavior of the SPEC2006 (serial) and the PARSEC 2.1 (parallel) benchmarks suites, and investigate the program phase behavior found in parallel applications with different parallelization models. To this end, we extend a general purpose runtime phase desection library to handle parallel applications. Our results reveal that serial applications have significantly more program phases (2.4x) with larger variation in CPI (1.5x) compared to parallel applications. While the number of phases are fewer in parallel applications, there still exists interesting phase behavior. In particular, we find that data-parallel applications have shorter phases with more threads. This makes phase-guided runtime optimizations (e.g., dynamic voltage frequency scaling) less attractive as the number of threads grows. Meaning it is much more difficult to exploit runtime optimizations in parallel applications.
Keywords :
benchmark testing; optimisation; parallel processing; software libraries; software performance evaluation; CPI; PARSEC 2.1 benchmark suite; SPEC2006 benchmark suite; cycle per instruction; data-parallel applications; general purpose runtime phase desection library; large scale phase behavior; parallel applications; parallelization model; phase-guided runtime optimization; program phase behavior; serial SPEC benchmark suite; serial applications; time-varying behavior; Benchmark testing; Hardware; Libraries; Measurement; Optimization; Runtime; Vectors;
Conference_Titel :
Workload Characterization (IISWC), 2012 IEEE International Symposium on
Conference_Location :
La Jolla, CA
Print_ISBN :
978-1-4673-4531-6
DOI :
10.1109/IISWC.2012.6402900