DocumentCode :
587794
Title :
Inspection of thin-film solar cell processing by laser-induced breakdown spectroscopy and neural networks
Author :
Diego-Vallejo, David ; Eichler, Hans Joachim ; Ashkenasi, D.
Author_Institution :
Inst. of Opt. & Atomic Phys., Tech. Univ. Berlin, Berlin, Germany
fYear :
2012
fDate :
29-31 Oct. 2012
Firstpage :
1
Lastpage :
2
Abstract :
Laser scribing is used in the manufacturing process of thin-film solar cells. Selective material ablation is required to remove the desired layers while minimizing the damage caused to the rest of the structure with the aim of improving efficiency of solar cells and reducing production costs. To that end, laser-induced breakdown spectroscopy (LIBS) assisted by artificial neural networks (ANN) was implemented as monitoring tool during laser scribing. The performance of this method to identify transition between layers presented low error and high precision. Therefore, the feasibility of using plasma emission spectra for inspection of solar cell processing was demonstrated.
Keywords :
automatic optical inspection; laser ablation; laser beam effects; neural nets; optical engineering computing; plasma diagnostics; solar cells; visible spectra; ANN; LIBS; artificial neural networks; laser scribing; laser-induced breakdown spectroscopy; neural networks; plasma emission spectra; selective material ablation; thin-film solar cell processing; Fiber lasers; Films; Laser applications; Microscopy; Mirrors; Optical fiber networks; Zinc oxide; Thin-film solar cells; artificial neural networks; laser-induced breakdown spectroscopy; photovoltaic manufacturing; processing inspection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optomechatronic Technologies (ISOT), 2012 International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4673-2875-3
Type :
conf
DOI :
10.1109/ISOT.2012.6403264
Filename :
6403264
Link To Document :
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