DocumentCode
587928
Title
Diagnosing the ion beam on the Applied-B diode
Author
Burns, E. J. T. ; Crow, J. T. ; Dreike, P. L. ; Johnson, D. J. ; Leeper, R. J. ; Mix, L. P. ; Perry, F. C. ; Slutz, S. A. ; Stygar, W. A. ; Chang, Joana
Author_Institution
Sandia National Laboratories, Albuquerque, NM 87185, USA
fYear
1983
fDate
12-14 Sept. 1983
Firstpage
518
Lastpage
521
Abstract
A variety of diagnostics measure the ion beam parameters from the Applied-B diode on the PBFA-I accelerator. New hanger dB/dt monitors measure the voltage in the diode feeds. The total proton charge is measured by Li/Cu activation. A Rutherford-scatterer, Thomson parabola particle analyzer measures approximately 50% of the ion current as carbon and oxygen ions from the epoxy-filled grooved anodes. The microscopic divergence of the proton beam is 15 and 25 milliradians HWHM in the horizontal and vertical directions, respectively, as measured by a Rutherford-scattering camera.
fLanguage
English
Publisher
ieee
Conference_Titel
High-Power Particle Beams, 1983. HPPB. 5th International Conference on
Conference_Location
San Francisco, CA, USA
Type
conf
Filename
6403687
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