DocumentCode :
588146
Title :
Quasi-double gate mode for sleep transistors in UTBB FD SOI low-power high-speed applications
Author :
Bol, David ; Kilchytska, V. ; De Vos, J. ; Andrieu, F. ; Flandre, Denis
Author_Institution :
ICTEAM Inst., Univ. catholique de Louvain, Louvain-la-Neuve, Belgium
fYear :
2012
fDate :
1-4 Oct. 2012
Firstpage :
1
Lastpage :
2
Abstract :
Power-gating enables low stand-by power for high-speed applications. In this paper, we exploit the unique feature of quasi-double gate (QDG) mode MOSFETs in UTBB SOI to boost the performances of the power-gating sleep transistor. According to experimental results on a 10-nm BOX, at nominal Vg QDG mode enables up to 35% width and thereby leakage reduction for the sleep transistor. At circuit level, a charge pump architecture is proposed to generate the QDG back-gate bias for a 100-mA power-gated CPU with sub-100 ns wake-up/sleep times and negligible power/area overheads.
Keywords :
MOSFET; charge pump circuits; low-power electronics; silicon-on-insulator; MOSFET QDG mode; UTBB FD SOI low-power high-speed applications; charge pump architecture; circuit level; current 100 mA; leakage reduction; power-area overheads; power-gating; power-gating sleep transistor; quasidouble gate mode; size 10 nm; ultrathin body and buried oxide fully-depleted SOI technology; Charge pumps; Logic gates; MOSFETs; Semiconductor device modeling; Switching circuits; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI Conference (SOI), 2012 IEEE International
Conference_Location :
NAPA, CA
ISSN :
1078-621X
Print_ISBN :
978-1-4673-2690-2
Electronic_ISBN :
1078-621X
Type :
conf
DOI :
10.1109/SOI.2012.6404370
Filename :
6404370
Link To Document :
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