• DocumentCode
    588639
  • Title

    State-Based Testing: Industrial Evaluation of the Cost-Effectiveness of Round-Trip Path and Sneak-Path Strategies

  • Author

    Holt, Nina Elisabeth ; Torkar, Richard ; Briand, Lionel ; Hansen, Karsten

  • Author_Institution
    Simula Res. Lab., Lysaker, Norway
  • fYear
    2012
  • fDate
    27-30 Nov. 2012
  • Firstpage
    321
  • Lastpage
    330
  • Abstract
    In the context of safety-critical software development, one important step in ensuring safe behavior is conformance testing, i.e., checking compliance between expected behavior and implementation. Round-trip path testing (RTP) is one example of conformance testing. Another essential step, however, is sneak-path testing, that is testing of how software reacts to unexpected events for a particular system state. Despite the importance of being systematic while testing, all testing activities take place, even for safety-critical software, under resource constraints. In this paper, we present an empirical evaluation of the cost-effectiveness of RTP when combined with sneak-path testing in the context of an industrial control system. Results highlight the importance of sneak-path testing since unexpected behavior is shown to be difficult to detect by other common, state-based test strategies. Results also suggest that sneak-path testing is a cost-effective supplement to RTP.
  • Keywords
    program testing; safety-critical software; RTP; cost effectiveness; industrial evaluation; round trip path; round trip path testing; safe behavior; safety-critical software development; sneak path strategies; sneak path testing; state based test strategies; Context; Data models; Object oriented modeling; Safety; Software; Testing; Unified modeling language; Round-trip path testing; UML; automated tool support; cost-effectiveness; empirical evaluation; industrial case study; sneak-path testing; state-based testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering (ISSRE), 2012 IEEE 23rd International Symposium on
  • Conference_Location
    Dallas, TX
  • ISSN
    1071-9458
  • Print_ISBN
    978-1-4673-4638-2
  • Type

    conf

  • DOI
    10.1109/ISSRE.2012.17
  • Filename
    6405380