• DocumentCode
    588652
  • Title

    Cost Effective Reliability Centric Validation Model for Automotive ECUs

  • Author

    Pandey, Akhilesh Kumar ; Jessy, S. ; Diwanji, V.

  • Author_Institution
    Cognizant Technol. Solutions, Hyderabad, India
  • fYear
    2012
  • fDate
    27-30 Nov. 2012
  • Firstpage
    38
  • Lastpage
    44
  • Abstract
    Automotive Electronic Control Units (ECUs) are usually the most complicated and powerful embedded systems in an automobile. Verification and validation of these ECUs poses challenges due to exponential growth in the size and complexity of ECUs´s software. This paper provides a new functional complexity metric that can be derived from the specification and can be used to estimate the total number of test cases required. Further, ECUs need to be verified and validated in accordance with their operational profile. Testing with operational profile will be cost effective with better reliability confidence. At the same time operational profile based testing can speed-up the V&V process by allocating the resources in relation to use and criticality. In this paper, the operational profile method is applied, as a case study, to the front and rear fog light ECU. Methods for deriving function points, functional complexity, computing the number of test cases, developing operational profiles, and test case allocation are presented. Additional benefits are also shown by integrating the functional complexity metric with the operational profile.
  • Keywords
    automatic test software; automotive electronics; control engineering computing; embedded systems; program verification; software reliability; V and V process; automotive ECU software; automotive electronic control units; cost effective reliability centric validation model; embedded systems; front fog light ECU; functional complexity metric; operational profile based testing; rear fog light ECU; reliability confidence; resource allocation; Complexity theory; Measurement; Reliability; Software; Switches; Testing; Vehicles; electronic control unit; functional complexity; operational profile based testing (OPBT); reliability; validation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering Workshops (ISSREW), 2012 IEEE 23rd International Symposium on
  • Conference_Location
    Dallas, TX
  • Print_ISBN
    978-1-4673-5048-8
  • Type

    conf

  • DOI
    10.1109/ISSREW.2012.29
  • Filename
    6405414