DocumentCode :
588655
Title :
Targeting Specific Customer Satisfactions Issues with ODC Analysis
Author :
Chillarege, Ram
fYear :
2012
fDate :
27-30 Nov. 2012
Firstpage :
64
Lastpage :
64
Abstract :
Often, the task of quality improvement is complicated by having defect backlogs and process gaps that seem too hard to tackle in a short period of time. This is particularly true of most development organizations that have performed root cause analysis or process assessments which identify long list of potential improvement opportunities. The list include identification of one or more of a variety of issues - such as architecture weaknesses, test coverage inadequacy, inadequate regression opportunity, weak code review or inadequacy of appropriate skills.
Keywords :
customer satisfaction; ODC analysis; customer satisfaction; defect backlog; development organization; process assessment; process gap; root cause analysis; Abstracts; Customer satisfaction; IEEE Potentials; Organizations; Random access memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Reliability Engineering Workshops (ISSREW), 2012 IEEE 23rd International Symposium on
Conference_Location :
Dallas, TX
Print_ISBN :
978-1-4673-5048-8
Type :
conf
DOI :
10.1109/ISSREW.2012.105
Filename :
6405419
Link To Document :
بازگشت