• DocumentCode
    588665
  • Title

    Design-Model-Based Test Data Generation for Database Applications

  • Author

    Tanno, H. ; Xiaojing Zhang ; Hoshino, Takashi

  • Author_Institution
    Software Innovation Center, NTT, Tokyo, Japan
  • fYear
    2012
  • fDate
    27-30 Nov. 2012
  • Firstpage
    201
  • Lastpage
    206
  • Abstract
    This research focuses on testing enterprise systems, more concretely on how to automatically generate the initial test data to be entered into the relational database to support each test case. Existing approaches cannot generate initial database entries to suit complicated business logic states such as reading the database more than once, searching the database by partial string matching, or setting primary and foreign key constraints on the database scheme. To solve these limitations, we propose a method for initial database generation. This method adopts a design model that can handle the complicated business logic states given above, and from this design model, our method generates appropriate initial database entries, it employs a step-by-step approach using the constraints extracted from the design model. The proposed method enables us to automatically generate initial database entries for a wide range of test cases and thus supports the testing of industrial-level enterprise systems. Using three industrial-level enterprise systems as case studies, we confirm that our method properly generated initial databases for 72% to 100% of the test cases in which an initial database was needed.
  • Keywords
    business data processing; relational databases; business logic states; database applications; design-model-based test data generation; industrial-level enterprise systems; partial string matching; relational database; Algorithm design and analysis; Business; Prototypes; Testing; Visual databases; XML; database application; design model; model based testing; test case generation; test data generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering Workshops (ISSREW), 2012 IEEE 23rd International Symposium on
  • Conference_Location
    Dallas, TX
  • Print_ISBN
    978-1-4673-5048-8
  • Type

    conf

  • DOI
    10.1109/ISSREW.2012.32
  • Filename
    6405442