DocumentCode
589480
Title
Performance aware partitioning for 3D-SOCs
Author
Kumar, Ajit ; Reddy, S.M. ; Becker, B. ; Pomeranz, Irith
Author_Institution
Electr. & Comput. Eng. Dept., Univ. of Iowa, Iowa City, IA, USA
fYear
2012
fDate
4-7 Nov. 2012
Firstpage
163
Lastpage
166
Abstract
Through silicon vias (TSVs) have a significant impact on the area and timing performance of a 3D-SOC. Performance aware design partitioning is required to reduce delay by placing gates on critical paths close to each other on the same or adjacent dies in the 3D-SOC. Also, pre-bond test of dies in the 3D-SOC is required to insure correct functionality of the dies before bonding. Additional design for test (DFT) logic for pre-bond test also depends on the design partitions used. In this work we propose a hypergraph based multi-objective netlist partitioning scheme to improve timing performance of 3D-SOC while keeping additional DFT cost low. Accurate interconnect estimation models are incorporated during partitioning to reduce delay and interconnect length variations across dies. Results on ISCAS89 and ITC99 benchmark circuits demonstrate the improved timing performance and reduced DFT cost using the proposed approach.
Keywords
design for testability; graph theory; integrated circuit design; integrated circuit interconnections; integrated circuit testing; system-on-chip; three-dimensional integrated circuits; 3D-SOC prebond testing; DFT cost low; DFT logic; ISCAS89 benchmark circuits; ITC99 benchmark circuits; TSV; area performance; critical paths; delay reduction; design for test logic; hypergraph-based multiobjective netlist partitioning scheme; interconnect estimation models; interconnect length variations; performance aware design partitioning; through silicon vias; timing performance; Delay; Discrete Fourier transforms; Integrated circuit interconnections; Logic gates; Partitioning algorithms; Through-silicon vias;
fLanguage
English
Publisher
ieee
Conference_Titel
SoC Design Conference (ISOCC), 2012 International
Conference_Location
Jeju Island
Print_ISBN
978-1-4673-2989-7
Electronic_ISBN
978-1-4673-2988-0
Type
conf
DOI
10.1109/ISOCC.2012.6407065
Filename
6407065
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