DocumentCode :
589511
Title :
How to automate millions lines of top-level UVM testbench and handle huge register classes
Author :
Namdo Kim ; Young-Nam Yun ; Young-Rae Cho ; Kim, Jin Bae ; Byeong Min
Author_Institution :
Infrastruct. Design Center, Samsung Electron. Co. Ltd., Yongin, South Korea
fYear :
2012
fDate :
4-7 Nov. 2012
Firstpage :
405
Lastpage :
407
Abstract :
Not only design automation, but also testbench (TB) automation heavily affects design period, so that diverse TB automation solutions have been developed and applied to the verifications ranging from IP level to top-level. Top-level verification environment is much more complex and big, approximately 2M lines of code (LOC), so automatic generation of top-level TB is an inevitable process for competitive design period. This paper presents an experience of SV (SystemVerilog) UVM (Universal Verification Methodology) TB automation on an over 100M gate top level SoC design. Most of the TB, 88% of 2M LOC except test scenarios and user codes, has been automatically generated by the proposed automation solution. The automation solution has strong flexibility and high level maintainability upon frequent specification changes. Also, the configurable TB for various DUTs resulted 50% simulation performance enhancement.
Keywords :
electronic design automation; formal verification; hardware description languages; integrated circuit design; system-on-chip; DUT; IP level; LOC; SV UVM; SoC design; SystemVerilog universal verification methodology TB automation; TB automation solutions; automatic generation; competitive design period; design automation; huge register classes; lines of code; simulation performance enhancement; testbench automation; top-level UVM testbench; top-level verification environment; user codes; Automation; Data models; IP networks; Logic gates; Registers; Standards; System-on-a-chip; SoC; SystemVerilog; UVM; Verification; testbench;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SoC Design Conference (ISOCC), 2012 International
Conference_Location :
Jeju Island
Print_ISBN :
978-1-4673-2989-7
Electronic_ISBN :
978-1-4673-2988-0
Type :
conf
DOI :
10.1109/ISOCC.2012.6407127
Filename :
6407127
Link To Document :
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