Title :
A method of achieving the maximum write endurance for storage systems through wear-leveling supported by spare regions
Author :
Kim, Heonhwan ; Okada, Kenichi
Author_Institution :
Data Storage Inst., Singapore, Singapore
fDate :
Oct. 31 2012-Nov. 2 2012
Abstract :
A cost-effective and easy-to-implement method is proposed to maximize the write endurance for solid-state memories in terms of the metric called “normalized endurance” (NE). The concept of spare regions is introduced in the proposed wear-leveling algorithm to combine with the existing method proposed by IBM. A new formula has been obtained to maximize the NE value with a small cost of memory.
Keywords :
magnetic disc storage; random-access storage; maximum write endurance; normalized endurance; solid-state memories; spare region; storage system; wear-leveling; Algorithm design and analysis; Flash memory; Indexes; Measurement; Nonvolatile memory; Radiation detectors; spare regions; storage system; system endurance; wear leveling;
Conference_Titel :
APMRC, 2012 Digest
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-4734-1
