Title :
Two-dimensional partial response maximum likelihood at rear for bit-patterned media
Author :
Koo, Kyoungchoul ; Kim, Seung-Yeon ; Jung, J. ; Lee, Jeyull ; Choi, Michael ; Goh, Takashi ; Kim, Sungho
Author_Institution :
Dept. of Electr. Eng., Pohang Univ. of Sci. & Technol. (POSTECH), Pohang, South Korea
fDate :
Oct. 31 2012-Nov. 2 2012
Abstract :
Compared with conventional partial response maximum likelihood (PRML), we propose new structure of two-dimensional (2D) PRML for bit-patterned media storage. The proposed PRML at rear shows superior bit error rate performance despite no iteration in 2D soft output Viterbi algorithm.
Keywords :
error statistics; storage media; 2D PRML; 2D soft output Viterbi algorithm; bit error rate; bit-patterned media storage; partial response maximum likelihood; Equalizers; Intersymbol interference; Signal to noise ratio; Viterbi algorithm; bit-patterned media; equalizer; intersymbol interference; intertrack interference; least mean square; recursive least square; two-dimensional partial response maximum likelihood; two-dimensional soft output Viterbi algorithm;
Conference_Titel :
APMRC, 2012 Digest
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-4734-1
