Title :
Ontology-based model for Rational Unified Process artifacts traceability
Author :
Yassin, S.M. ; Moawad, I.F. ; Gohary, R.E. ; Tolba, M.F.
Author_Institution :
Fac. of Comput. & Inf. Sci., Ain shams Univ., Cairo, Egypt
Abstract :
Traceability of software artifacts has been recognized as an important factor for supporting various activities in the software development process. Although recent research approaches facilitate the creation and refinement of the domain Ontology to ensure the consistency of the software artifacts during the software development, there is not enough attention to the importance of linking both software verification and artifacts traceability. This paper aims at improving the efficiency of the whole Rational Unified Process (RUP) software development by proposing an Ontology-based model. The domain Ontology is created and refined automatically from different UML artifact versions. The software artifacts released from the RUP iterations are verified automatically, and hence the artifacts traceability and the automatic software verification processes are facilitated at less cost, time and effort. To illustrate how to utilize the model, a case study and a simple discussion are presented.
Keywords :
formal verification; ontologies (artificial intelligence); RUP iteration; RUP software; UML artifact version; Unified Modeling Language; domain ontology; ontology-based model; rational unified process software; software artifact traceability; software development process; software verification; OWL; Ontologies; Semantics; Software; Software algorithms; Unified modeling language; Artifact Traceability; Knowledge Engineering; Knowledge Sharing; Rational Unified Process words; Software Automatic Verification;
Conference_Titel :
Computer Engineering & Systems (ICCES), 2012 Seventh International Conference on
Conference_Location :
Cairo
Print_ISBN :
978-1-4673-2960-6
DOI :
10.1109/ICCES.2012.6408522