• DocumentCode
    589887
  • Title

    Ontology-based model for Rational Unified Process artifacts traceability

  • Author

    Yassin, S.M. ; Moawad, I.F. ; Gohary, R.E. ; Tolba, M.F.

  • Author_Institution
    Fac. of Comput. & Inf. Sci., Ain shams Univ., Cairo, Egypt
  • fYear
    2012
  • fDate
    27-29 Nov. 2012
  • Firstpage
    241
  • Lastpage
    248
  • Abstract
    Traceability of software artifacts has been recognized as an important factor for supporting various activities in the software development process. Although recent research approaches facilitate the creation and refinement of the domain Ontology to ensure the consistency of the software artifacts during the software development, there is not enough attention to the importance of linking both software verification and artifacts traceability. This paper aims at improving the efficiency of the whole Rational Unified Process (RUP) software development by proposing an Ontology-based model. The domain Ontology is created and refined automatically from different UML artifact versions. The software artifacts released from the RUP iterations are verified automatically, and hence the artifacts traceability and the automatic software verification processes are facilitated at less cost, time and effort. To illustrate how to utilize the model, a case study and a simple discussion are presented.
  • Keywords
    formal verification; ontologies (artificial intelligence); RUP iteration; RUP software; UML artifact version; Unified Modeling Language; domain ontology; ontology-based model; rational unified process software; software artifact traceability; software development process; software verification; OWL; Ontologies; Semantics; Software; Software algorithms; Unified modeling language; Artifact Traceability; Knowledge Engineering; Knowledge Sharing; Rational Unified Process words; Software Automatic Verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Engineering & Systems (ICCES), 2012 Seventh International Conference on
  • Conference_Location
    Cairo
  • Print_ISBN
    978-1-4673-2960-6
  • Type

    conf

  • DOI
    10.1109/ICCES.2012.6408522
  • Filename
    6408522