Title :
Modelling and analysis of electromagnetic interferences for a 32-bit digital signal controller
Author :
Zhou Changlin ; Wang Jianmin ; Pan Xiangfeng ; Gao Fei ; Yu Daojie
Author_Institution :
Zhengzhou Inf. Sci. & Technol. Institue, Zhengzhou, China
Abstract :
This paper presents the modelling and analysis of electromagnetic interferences (EMI) for a 32-bit digital signal controller (DSC) that enables uncompromising performance and real-time control applications for high electromagnetic compatibility (EMC) requirement. The EMI behaviour model of the DSC for conducted emission, built upon the package and chip dies, is used to predict the EM emissions of the chip and printed circuit board (PCB) levels. The characterization of EMI has been analyzed by circuital simulations and conducted emission measurements according to the EMC model. It is successfully demonstrated that the simulated results are consistent with the predictions generated by using the proposed model. And the DSCs chip model, simulation and measurement of the EMI are necessary for the analysis, prediction, and compatibility of the PCB and systems design.
Keywords :
digital signal processing chips; electromagnetic compatibility; electromagnetic interference; microcontrollers; printed circuits; DSC chip model; EM emissions; EMC model; EMC requirement; EMI analysis; EMI behaviour model; PCB level; chip dies; chip level; circuital simulations; conducted emission measurements; digital signal controller; electromagnetic compatibility requirement; electromagnetic interferences; printed circuit board level; real-time control application; system design; Analytical models; Clocks; Electromagnetic compatibility; Electromagnetic interference; Electromagnetics; Integrated circuit modeling; Predictive models; conducted emission measurement; digital signal controllers (DSCs); electromagnetic compatibility (EMC); electromagnetic emission model; electromagnetic interference (EMI); integrated circuit (IC);
Conference_Titel :
Antennas, Propagation & EM Theory (ISAPE), 2012 10th International Symposium on
Conference_Location :
Xian
Print_ISBN :
978-1-4673-1799-3
DOI :
10.1109/ISAPE.2012.6408975