DocumentCode :
59022
Title :
A Flexible IGZO Thin-Film Transistor With Stacked {\\rm TiO}_{2} -Based Dielectrics Fabricated at Room Temperature
Author :
Hsu, H.-H. ; Chang, Chih-Yung ; Cheng, Chong-hu
Author_Institution :
Department of Electronics Engineering, National Chiao Tung University, Hsinchu, Taiwan
Volume :
34
Issue :
6
fYear :
2013
fDate :
Jun-13
Firstpage :
768
Lastpage :
770
Abstract :
This letter demonstrates the feasibility of full room temperature InGaZnO thin-film transistor (TFT) using trilayer gate dielectric on flexible substrate. Through integrating high- \\kappa ~{\\rm SiO}_{2}/{\\rm TiO}_{2}/{\\rm SiO}_{2} (STS) gate-stack as well as InGaZnO channel thickness modulation, the resulting flexible indium–gallium–zinc oxide (IGZO)/STS TFTs show low threshold voltage of 0.5 V, small subthreshold swing of 0.129 V/decade, high field effect mobility of 76 {\\rm cm}^{2}/{\\rm Vs} , and good I_{{\\rm ON}}/I_{{\\rm OFF}} ratio of 6.7\\times 10^{5} , which have the potential for the application of high-resolution flexible display.
Keywords :
${rm TiO}_{2}$; High-$kappa$ ; indium–gallium–zinc oxide (IGZO); thin-film transistor (TFT);
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2013.2258455
Filename :
6515620
Link To Document :
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