DocumentCode :
590275
Title :
A novel in-loop filter based on CLDT masking effect model for HEVC
Author :
Binji Luo ; Chonghua Liu ; Gong Zhang ; Feng Ye ; Bo Yang
Author_Institution :
Sch. of Inf. & Commun. Eng., Beijing Univ. of Posts & Telecommun, Beijing, China
fYear :
2012
fDate :
27-30 Nov. 2012
Firstpage :
1
Lastpage :
6
Abstract :
HEVC is the current joint video coding standardization project of ITU-T Video Coding Experts Group and Moving Picture Experts Group. It includes deblocking filter (DF) and adaptive loop filter (ALF) after the deblocking filter. To improve the accuracy, the deblocking filter is modified with the parameter information of intra coded blocks in this paper. Considering that the masking effect of human visual system (HVS) will eliminate the visibility of the blocking artifacts, a combined luminance and directional-texture (CLDT) masking effect model-based DF is proposed. At last, a novel Wiener-based in-loop filter is proposed, which is applied to eliminate the quantization error using both pre-DF signal and post-DF signal. Experimental results show efficiency improvement and subjective quality improvement compared with HEVC test model 2 (HM2.0) anchor.
Keywords :
Wiener filters; adaptive filters; image texture; video coding; ALF; CLDT masking effect model; DF; HEVC test model 2 anchor; HM2.0 anchor; HVS masking effect; ITU-T Video Coding Experts Group; Moving Picture Experts Group; Wiener-based in-loop filter; adaptive loop filter; combined luminance-directional-texture masking effect model; deblocking filter; efficiency improvement; human visual system masking effect; intracoded blocks; joint video coding standardization project; post-DF signal; pre-DF signal; quantization error elimination; subjective quality improvement; Adaptive filters; Complexity theory; Encoding; Information filters; Wiener filters; Adaptive loop filter; HEVC; deblcoking filter; human visual system;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Visual Communications and Image Processing (VCIP), 2012 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4673-4405-0
Electronic_ISBN :
978-1-4673-4406-7
Type :
conf
DOI :
10.1109/VCIP.2012.6410745
Filename :
6410745
Link To Document :
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