Title :
An adaptive covariance-based edge diffusion image enlargement method
Author :
Tao Fan ; Haiwu Zhao ; Guozhong Wang ; Jianwen Chen ; Feng Xu ; Villasenor, John
Author_Institution :
Sch. of Commun. & Inf. Eng., Shanghai Univ., Shanghai, China
Abstract :
We discuss image or video enlargement methods aimed at computationally constrained environments. Traditional enlargement algorithms such as linear or cubic interpolation have been applied in many applications. However the performance of these approaches is limited by artifacts such as blurring and jagged edges. More sophisticated iterative and learning-based algorithms have been proposed to address these issues, but they typically involve very high computational complexity. We present an adaptive covariance-based edge diffusion (ACED) image enlargement method that offers both good performance and low complexity. Different from other edge-directed interpolation algorithms, the proposed method uses combination of a novel edge-directed judgment which can choose different spread templates adaptively to estimate local covariance coefficients and edge diffusion to reduce artifacts. Experimental results show that the proposed method gives performs well both in terms of subjective quality as well as objective measures.
Keywords :
computational complexity; edge detection; interpolation; iterative methods; learning (artificial intelligence); video signal processing; ACED image enlargement method; adaptive covariance-based edge diffusion image enlargement method; computational complexity; cubic interpolation; edge-directed interpolation algorithms; edge-directed judgment; iterative algorithms; learning-based algorithms; linear interpolation; local covariance coefficient estimation; spread templates; subjective quality; video enlargement methods; Computational complexity; Equations; Image edge detection; Image resolution; Interpolation; Vectors; Video Enlarge; Video Processing; Web TV Convergence;
Conference_Titel :
Visual Communications and Image Processing (VCIP), 2012 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4673-4405-0
Electronic_ISBN :
978-1-4673-4406-7
DOI :
10.1109/VCIP.2012.6410843