Title :
Novel packaging and high-current pulse-switching of 1.0 cm2 SiC SGTOs
Author :
O´Brien, H. ; Ogunniyi, Aderinto ; Scozzie, Charles ; Lin Cheng ; Agarwal, Abhishek ; Shaheen, W. ; Francois, M. ; Temple, Victor
Author_Institution :
U. S. Army Res. Lab., Adelphi, MD, USA
Abstract :
The U.S. Army Research Laboratory has been driving the advancement of high-voltage, high-current silicon carbide devices and packaging through collaborations with Cree, Inc. and Silicon Power Corp. This paper reports on 1.0 cm2 Super-GTOs fabricated by Cree, packaged by Silicon Power, and evaluated under pulse conditions at the Army Research Laboratory. These semiconductor switches were utilized to rapidly discharge capacitive energy into a resistive load. The Super-GTOs were packaged in parallel pairs using low-inductance thinPak lids for 2.0 cm2 total silicon carbide area with high-voltage blocking capability up to 9.0 kV. The two-chip arrays were switched at three different pulse widths, ranging from 45μs to 75μs (full-width at half-maximum), up to peak current capability. The maximum current switched was 11.7 kA, corresponding to 8.0 kA/cm2 over the mesa, with a 10-90% dI/dt of 1.5 kA/μs. Two arrays were also paralleled and switched to 18 kA with current sharing within 1%. Individually the arrays were also reliably switched up to 100 pulses. The results are encouraging for the device design and packaging techniques, and for the capability of paralleling many devices to reach higher pulse currents.
Keywords :
packaging; power semiconductor switches; silicon compounds; thyristors; wide band gap semiconductors; SGTO; SiC; current 11.7 kA; current 18 kA; high current pulse switching; high voltage blocking capability; packaging; parallel pairs; semiconductor switches; super GTO; thinPak lids; voltage 9.0 kV; Logic gates; Packaging; Reliability; Silicon; Silicon carbide; Switches; power semiconductor switches; pulse power system switches; pulse-shaping circuits; thyristors;
Conference_Titel :
Lester Eastman Conference on High Performance Devices (LEC), 2012
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-2298-0
Electronic_ISBN :
978-1-4673-2300-0
DOI :
10.1109/lec.2012.6410981