Title :
Physics of visible and UV LED devices
Author :
Dobrinsky, A. ; Shatalov, M. ; Gaska, R. ; Shur, M.
Author_Institution :
Sensor Electron. Technol., Inc., Columbia, SC, USA
Abstract :
Large performance gap between the performance visible and deep ultraviolet light emitting diodes (DUV LEDs) is primarily attributed to material properties of high aluminum content group III-nitride semiconductor alloys used for DUV LEDs. For current state of art DUV LED devices the external quantum efficiencies (EQE) - ranges from 2% to 10%. A lower DUV LED efficiency is also due to poor transparency of semiconductor layers to UV light, poor UV light reflectivity of n-and p- contacts, low conductivity of semiconductor heterostructure, and high contact-to-semiconductor layer resistance. In this paper we discuss and compare physics of DUV LEDs and discuss the design of the next generation of DUV LEDs.
Keywords :
III-V semiconductors; electrical conductivity; electrical contacts; light emitting diodes; optical design techniques; reflectivity; semiconductor heterojunctions; transparency; DUV LED device; EQE; III-nitride semiconductor alloys; UV light reflectivity; deep ultraviolet light emitting diode; external quantum efficiencies; high aluminum content group; high contact-to-semiconductor layer resistance; low conductivity; material properties; n-contact; p-contact; semiconductor heterostructure; semiconductor layers; transparency; visible LED device; visible light emitting diode; Aluminum gallium nitride; Charge carrier processes; Encapsulation; Light emitting diodes; Performance evaluation; Physics; Radiative recombination; LED; Ultraviolet; external quantum efficiency; internal quantum efficiency;
Conference_Titel :
Lester Eastman Conference on High Performance Devices (LEC), 2012
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-2298-0
Electronic_ISBN :
978-1-4673-2300-0
DOI :
10.1109/lec.2012.6410995