DocumentCode :
590392
Title :
Fine patterning of electrets for sensors and energy harvesters
Author :
Leonov, Vladimir ; Goedbloed, M. ; De Nooijer, C. ; van Schaijk, R.
Author_Institution :
Heterogeneous Integrated Microsyst. Dept., Imec, Leuven, Belgium
fYear :
2012
fDate :
28-31 Oct. 2012
Firstpage :
1
Lastpage :
4
Abstract :
Charge patterning on 1.3 μm-wide electret lines has successfully been demonstrated with a voltage of 80 V between charged Si3N4 lines and discharged unpatterned underlying SiO2. The fabrication technology and charge patterning methods were developed. A nine-month aging test on open air confirms that there is seemingly no dependence of charge retention time on line width within the 1 mm to 1.3 μm range. Accounting for the decay of surface potential during 9 months of aging, the charge lifetime in 1.3 μm-wide electret lines is about 40 years.
Keywords :
ageing; electrets; electric sensing devices; energy harvesting; silicon compounds; Si3N4; SiO2; aging test; charge patterning method; charge retention time dependence; electrets line patterning; energy harvester; sensor; size 1 mm to 1.3 mum; surface potential decay; time 9 month; unpatterned discharging; voltage 80 V; Annealing; Discharges (electric); Electrets; Electric potential; Fabrication; Temperature dependence; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2012 IEEE
Conference_Location :
Taipei
ISSN :
1930-0395
Print_ISBN :
978-1-4577-1766-6
Electronic_ISBN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2012.6411123
Filename :
6411123
Link To Document :
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