Title :
A 143dB 1.96% FPN linear-logarithmic CMOS image sensor with threshold-voltage cancellation and tunable linear range
Author :
Wei-Fan Chou ; Shang-Fu Yeh ; Chih-Cheng Hsieh
Author_Institution :
Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
This paper presents a high dynamic range (DR) linear-logarithmic (Lin-Log) CMOS image sensor (CIS) pixel with on-chip tunable linear range and threshold voltage cancellation scheme for reducing fix pattern noise (FPN). A column shared-OP with programmable gain was also applied to reduce the gain loss of source follower in conventional APS structure. A prototype chip with 100 × 100 pixel array and pixel pitch as 6 × 6 um2 and 3.3V operation has been designed and fabricated in 0.18um TSMC 1P6M standard process. The measured results achieve a dynamic range of 143dB, a FPN related to sensitivity in log response (rms/log-sensitivity) of 1.96%, and a FPN related to full-swing in log response (rms/Vlog-swing) of 0.45%, respectively.
Keywords :
CMOS image sensors; FPN linear-logarithmic CMOS image sensor; TSMC 1P6M standard process; column shared-OP; fix pattern noise linear-logarithmic CMOS image sensor; high DR Lin-Log CIS pixel; high dynamic range linear-logarithmic CMOS image sensor pixel; on-chip tunable linear range scheme; pixel array; pixel pitch; programmable gain; size 0.18 mum; source follower gain loss; threshold voltage cancellation scheme; tunable linear range; voltage 3.3 V; Arrays; CMOS image sensors; Dynamic range; Semiconductor device measurement; Sensitivity; System-on-a-chip; Threshold voltage;
Conference_Titel :
Sensors, 2012 IEEE
Conference_Location :
Taipei
Print_ISBN :
978-1-4577-1766-6
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2012.6411258