• DocumentCode
    590578
  • Title

    A MEMS based electrometer with a low-noise switched reset amplifier for charge measurement

  • Author

    Jaramillo, G. ; Horsley, David A. ; Buffa, C. ; Langfelder, Giacomo

  • Author_Institution
    Berkeley Sensor & Actuator Center, Univ. of California, Davis, Davis, CA, USA
  • fYear
    2012
  • fDate
    28-31 Oct. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Electrostatic charge measurements are at the base of chemical, physical and biological experiments. In this work the authors present an electrometer based on the vibrating capacitance of a microelectromechanical (MEMS) micromachined resonator. We present improvements on the low-noise readout amplifier by reducing input-referred voltage noise and parasitic capacitances. An amplifier has been designed to have a noise corner frequency well below the device´s operating frequency fn. The electrometer geometry allows for charge output signal measurements at 2fn minimizing feedthrough of driving signals. The sensor consists of a set of comb-finger capacitors placed on each side of a moving mass for push-pull driving. Operating at resonance, charge collected on the moving electrode is modulated and the induced voltage is read with a low-leakage very high-input impedance feedback amplifier. Due to the specific readout technique, a switched-reset is used to prevent charge saturation. Reduction of parasitic capacitance and increase in resolution is achieved through the careful selection and placement of discrete electronic components alongside the silicon MEMS chip.
  • Keywords
    charge measurement; electrometers; electrostatics; elemental semiconductors; silicon; MEMS based electrometer; charge output signal measurements; discrete electronic components; electrometer geometry; electrostatic charge measurements; induced voltage; low-noise readout amplifier; low-noise switched reset amplifier; minimizing feedthrough; parasitic capacitances; push-pull driving; reducing input-referred voltage noise; silicon MEMS chip; specific readout technique; vibrating capacitance; Capacitance; Capacitors; Charge measurement; Frequency measurement; Micromechanical devices; Noise; Resonant frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2012 IEEE
  • Conference_Location
    Taipei
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4577-1766-6
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2012.6411511
  • Filename
    6411511