Title :
The Angular Dependence of the Critical Current of
Doped
Author :
Malmivirta, M. ; Yao, L.D. ; Inkinen, S. ; Huhtinen, H. ; Palonen, H. ; Jha, R. ; Awana, V.P.S. ; Van Dijken, S. ; Paturi, P.
Author_Institution :
Dept. of Phys. & Astron., Univ. of Turku, Turku, Finland
Abstract :
The angular dependencies of the critical current of BaCeO3 (BCO) doped YBa2Cu3O6+x (YBCO) thin films grown with pulsed laser deposition (PLD) on SrTiO3 (001) were systematically investigated. The BCO concentration in the YBCO matrix was varied between 0-8 wt.%. Transmission electron microscopy confirmed that the 4% BCO containing sample has point-like, partly agglomerated BCO particles with diameter of 2.5 nm. The dopant degrades the crystal quality of YBCO but improves its in-field current carrying performance especially at low temperatures. The BCO addition affects the angular dependence of the critical current by broadening the B||ab-axis peak of YCBO but no c-axis peak is seen, which is contrary to BaZrO3 doped films made by PLD. Although the particles are point-like, it is found that a model featuring only isotropic pinning centers is not sufficient to describe the angular dependence of the samples where B||ab-axis of YCBO.
Keywords :
barium compounds; critical current density (superconductivity); high-temperature superconductors; pulsed laser deposition; superconducting thin films; transmission electron microscopy; yttrium compounds; SrTiO3 (001) surface; SrTiO3; YBa2Cu3O6+x-BaCeO3; angular dependence; critical current; crystal quality; isotropic pinning centers; pulsed laser deposition; size 2.5 nm; thin films; transmission electron microscopy; Anisotropic magnetoresistance; Critical current density (superconductivity); Current measurement; Pulsed laser deposition; Superconducting magnets; Temperature measurement; Yttrium barium copper oxide; $hbox{BaCeO}_{3}$ doping; Angular dependence of critical current; Pulsed laser deposition; YBCO thin films; pulsed laser deposition (PLD);
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2014.2376037