DocumentCode :
591463
Title :
Method for obtaining noise parameters using a vector network analyzer with an integrated noise receiver
Author :
Hayward, R.D.
Author_Institution :
TriQuint Semicond., Hillsboro, OR, USA
fYear :
2012
fDate :
29-30 Nov. 2012
Firstpage :
1
Lastpage :
4
Abstract :
Agilent Technologies PNA-X Option 029 provides capability for noise figure measurements in a 50 Ohm environment. This paper describes a method for extending the analyzer´s capability to obtain measurements for noise parameter extraction. A source tuner is characterized at various tuner states. Each tuner state is de-embedded into the network analyzer dynamically. High sensitivity noise and in-situ gain measurements provide accurate noise figure to be captured at any reflection coefficient. Noise parameters may then be extracted from the subsequent measurements.
Keywords :
loss measurement; network analysers; Agilent technologies PNA-X Option 029; integrated noise receiver; noise figure measurement; noise parameter extraction; source tuner; vector network analyzer; Calibration; Gain measurement; Noise; Noise measurement; Optimized production technology; Semiconductor device measurement; Tuners; Low Noise Amplifiers; Network Analysis; Noise Figure; Noise Parameters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Symposium (ARFTG), 2012 80th ARFTG
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4673-4817-1
Electronic_ISBN :
978-1-4673-4820-1
Type :
conf
DOI :
10.1109/ARFTG.2012.6422439
Filename :
6422439
Link To Document :
بازگشت