DocumentCode :
59154
Title :
A 300-MS/s, 1.76-ps-Resolution, 10-b Asynchronous Pipelined Time-to-Digital Converter With on-Chip Digital Background Calibration in 0.13-µm CMOS
Author :
Jun-Seok Kim ; Young-Hun Seo ; Yunjae Suh ; Hong-June Park ; Jae-Yoon Sim
Author_Institution :
Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol. (POSTECH), Pohang, South Korea
Volume :
48
Issue :
2
fYear :
2013
fDate :
Feb. 2013
Firstpage :
516
Lastpage :
526
Abstract :
This paper presents an asynchronous pipelined all-digital 10-b time-to-digital converter (TDC) with fine resolution, good linearity, and high throughput. Using a 1.5-b/stage pipeline architecture, an on-chip digital background calibration is implemented to correct residue subtraction error in the seven MSB stages. An asynchronous clocking scheme realizes pipeline operation for higher throughput. The TDC was implemented in standard 0.13-μm CMOS technology and has a maximum throughput of 300 MS/s and a resolution of 1.76 ps with a total conversion range of 1.8 ns. The measured DNL and INL were 0.6 LSB and 1.9 LSB, respectively.
Keywords :
CMOS digital integrated circuits; asynchronous circuits; calibration; pipeline processing; time-digital conversion; CMOS technology; MSB stages; asynchronous clocking scheme; asynchronous pipelined time-to-digital converter; on-chip digital background calibration; pipeline architecture; pipeline operation; residue subtraction error; size 0.13 mum; time 1.76 ps; time 1.8 ns; word length 1.5 bit; word length 10 bit; Calibration; Delay; Linearity; Pipeline processing; Positron emission tomography; Throughput; Time domain analysis; Asynchronous pipeline; digital background calibration; time amplifier; time-to-digital converter (TDC);
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2012.2217892
Filename :
6335441
Link To Document :
بازگشت